High Temperature Probe

Single crystal probe with a replaceable delay line, applied for high temperature detection environment.

Features

· Supply 0° (ZH Type) Longitudinal Incidence and 45°/ 60°/70° (AH Type) Shear Wave incidence Delay Lines

· Supply 13 / 25 / 38mm three ZH types standard height delay lines, and 45°/60°/70° three shear wave AH types delay lines

· Two Types of Delay Lines:

HT1: Maximum 20seconds on workpiece at 200℃(392°F)

Ht2: Maximum 10seconds on workpiece at 300℃(572°F)

· Quick Change Structure of Delay Line and Probe

· Standard Lengths of ZH Type Delay Line matching with Probes:

φ10mm (0.375in) crystal probe with 13mm (0.5in) delay line

φ13/19mm (0.5/0.7in) crystal probe with 25mm (1.0in) delay line

· Probe face can be processed into different shapes to ensure good coupling with workpiece

· Top Mounting Microdot (L5) Connector

Attention：

1. When reach maximum contact time, probe is required to cool down to room temperature to working again.

2. The contact time is related to the contact temperature. For the specific relationship between them, please consult with Doppler transducer expert.

Applications

· Intermittent contact detection with high temperature workpiece (Castings, Forgings etx.,)

· Direct Flaw Detection

· Detection of curved surface of workpiece